The course aims to inculcate an appreciation of specific American authors and texts, along with the literary history of the United States. Participants will also get familiar with the relation between American literature and important related historical and socio-cultural developments. The course also aims to foster an understanding of the development of various genres, forms, and themes in select American literature.
Week 1:Introduction: Importance, Challenges, Levels of abstraction, Fault Models, Advanced issues
Week 2:Design for Testability: Introduction, Testability Analysis, DFT Basics, Scan cell design, Scan Architecture
Week 3:Design for Testability: Scan design rules, Scan design flow .
Fault Simulation: Introduction, Simulation models
Week 4:Fault Simulation: Logic simulation, Fault simulation
Week 5:Test Generation: Introduction, Exhaustive testing, Boolean difference, Basic ATPG algorithms
Week 6:Test Generation: ATPG for non stuck-at faults, Other issues in test generation
Built-In-Self-Test: Introduction, BIST design rules
Week 7:Built-In-Self-Test: Test pattern generation, Output response analysis, Logic BIST architectures
Week 8:Test Compression: Introduction, Stimulus compression
Week 9:Test Compression: Stimulus compression, Response compression
Week 10:Memory Testing: Introduction, RAM fault models, RAM test generation
Week 11:Memory Testing: Memory BIST
Power and Thermal Aware Test: Importance, Power models, Low power ATPG
Week 12:Power and Thermal Aware Test: Low power BIST, Thermal aware techniques