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Stanford University

Stanford Seminar - Flash Reliability in Production: The Expected and the Unexpected

Stanford University via YouTube

Overview

This course covers the expected and unexpected aspects of flash reliability in production. Students will learn about factors impacting flash reliability such as wear-out, type of flash, lithography, and workload. The course teaches how workload affects error rates, RBER, overall reliability, and uncorrectable errors. The teaching method includes analyzing field data and drive replacements. This course is intended for individuals interested in understanding flash reliability in production environments.

Syllabus

Introduction.
Main research interests.
Publicly available information.
Field data.
The data.
Drive replacements.
Errors experienced during a drive's lifecycle.
What factors impact flash reliability?.
Effect of wear-out (program erase cycles).
Effect of type of flash (SLC versus MLC).
Effect of lithography.
Effect of workload?.
How does workload affect error rates?.
RBER and overall reliability.
RBER and uncorrectable errors.
What is predictive of uncorrectable errors?.

Taught by

Stanford Online

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